用冲击电离法检测铁电体中的电场

Topical Meeting on Photorefractive Materials, Effects, and Devices II Pub Date : 1900-01-01 DOI:10.1364/pmed.1990.bp4

T. A. Rost, T. Rabson

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引用次数: 0

摘要

用冲击电离法研究了铁电薄膜中的空间电荷场。讨论了利用这种技术作为探针来帮助理解体光伏效应的可能性。

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Examination of Electric Fields in Ferroelectrics by Impact Ionization

The space charge fields present in ferroelectric thin films are examined with impact ionization. The possibility of using this technique as a probe to aid in the understanding of the bulk photovoltaic effect is discussed.

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来源期刊

$Topical Meeting on Photorefractive Materials, Effects, and Devices II$

Topical Meeting on Photorefractive Materials, Effects, and Devices II

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