利用热双稳效应表征微腔中的损耗

Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004. Pub Date : 2004-06-28 DOI:10.1063/1.1804240

H. Rokhsari, S. Spillane, K. Vahala

{"title":"利用热双稳效应表征微腔中的损耗","authors":"H. Rokhsari, S. Spillane, K. Vahala","doi":"10.1063/1.1804240","DOIUrl":null,"url":null,"abstract":"We investigate the role of absorption and scattering losses in limiting the quality factor of toroidal micro-cavities by monitoring the threshold power for thermal bistability in these structures.","PeriodicalId":280347,"journal":{"name":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"72","resultStr":"{\"title\":\"Loss characterization in micro-cavities using the thermal bistability effect\",\"authors\":\"H. Rokhsari, S. Spillane, K. Vahala\",\"doi\":\"10.1063/1.1804240\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We investigate the role of absorption and scattering losses in limiting the quality factor of toroidal micro-cavities by monitoring the threshold power for thermal bistability in these structures.\",\"PeriodicalId\":280347,\"journal\":{\"name\":\"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"72\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/1.1804240\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.1804240","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 72

摘要

我们通过监测环形微腔中热双稳的阈值功率来研究吸收和散射损耗在限制环形微腔质量因子中的作用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Loss characterization in micro-cavities using the thermal bistability effect

We investigate the role of absorption and scattering losses in limiting the quality factor of toroidal micro-cavities by monitoring the threshold power for thermal bistability in these structures.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.

自引率

0.00%

发文量