G. Bouders, X. N. Phu, J. Lecoq, M. Sylla, G. Rivoire
{"title":"非线性介质特性测量的成像方法","authors":"G. Bouders, X. N. Phu, J. Lecoq, M. Sylla, G. Rivoire","doi":"10.1364/pmed.1991.tua1","DOIUrl":null,"url":null,"abstract":"A non linear medium is placed in the focal plane of a 4f set up (fig.1). The Fourier spectrum S(u) induces phase and amplitude changes inside the material [1].","PeriodicalId":355924,"journal":{"name":"Photorefractive Materials, Effects, and Devices","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Imaging Method for Non Linear Medium Characteristic Measurements\",\"authors\":\"G. Bouders, X. N. Phu, J. Lecoq, M. Sylla, G. Rivoire\",\"doi\":\"10.1364/pmed.1991.tua1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A non linear medium is placed in the focal plane of a 4f set up (fig.1). The Fourier spectrum S(u) induces phase and amplitude changes inside the material [1].\",\"PeriodicalId\":355924,\"journal\":{\"name\":\"Photorefractive Materials, Effects, and Devices\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Photorefractive Materials, Effects, and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/pmed.1991.tua1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photorefractive Materials, Effects, and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/pmed.1991.tua1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Imaging Method for Non Linear Medium Characteristic Measurements
A non linear medium is placed in the focal plane of a 4f set up (fig.1). The Fourier spectrum S(u) induces phase and amplitude changes inside the material [1].