{"title":"制造变化中隐藏的挑战","authors":"S. Sayfan-Altman, R. Bloch, A. Manukovsky","doi":"10.1109/COMCAS52219.2021.9628997","DOIUrl":null,"url":null,"abstract":"In this work we will examine the manufacturing variation effect and design robustness in the context of complex PCB structures’ performance for high-speed links. A case study of robust design implementation for a differential capacitor structure is examined. The main design parameters variation is identified and key contributors to performance degradation are outlined. Then a method of maximizing design robustness is presented and a commonly used design is altered to maximize immunity to manufacturing variation. The proposed structure robustness is analyzed, and superior impedance control under various scenarios of expected manufacturing variation is demonstrated.","PeriodicalId":354885,"journal":{"name":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The Hidden Challenges in Manufacturing Variations\",\"authors\":\"S. Sayfan-Altman, R. Bloch, A. Manukovsky\",\"doi\":\"10.1109/COMCAS52219.2021.9628997\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work we will examine the manufacturing variation effect and design robustness in the context of complex PCB structures’ performance for high-speed links. A case study of robust design implementation for a differential capacitor structure is examined. The main design parameters variation is identified and key contributors to performance degradation are outlined. Then a method of maximizing design robustness is presented and a commonly used design is altered to maximize immunity to manufacturing variation. The proposed structure robustness is analyzed, and superior impedance control under various scenarios of expected manufacturing variation is demonstrated.\",\"PeriodicalId\":354885,\"journal\":{\"name\":\"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMCAS52219.2021.9628997\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMCAS52219.2021.9628997","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this work we will examine the manufacturing variation effect and design robustness in the context of complex PCB structures’ performance for high-speed links. A case study of robust design implementation for a differential capacitor structure is examined. The main design parameters variation is identified and key contributors to performance degradation are outlined. Then a method of maximizing design robustness is presented and a commonly used design is altered to maximize immunity to manufacturing variation. The proposed structure robustness is analyzed, and superior impedance control under various scenarios of expected manufacturing variation is demonstrated.