David Ha, Yuya Tomotoshi, Masahiro Senda, Hideyuki Watanabe, S. Katagiri, M. Ohsaki
{"title":"基于边界不确定性的分类器参数状态选择方法的改进","authors":"David Ha, Yuya Tomotoshi, Masahiro Senda, Hideyuki Watanabe, S. Katagiri, M. Ohsaki","doi":"10.1109/COMPEM.2019.8779090","DOIUrl":null,"url":null,"abstract":"We propose an improved version of our boundary-uncertainty-based method for selecting the optimal classifier parameter status that corresponds to the optimal Bayes boundary. Our original method could accurately estimate the optimal status on various real-life tasks. However, several tasks showed improvement room for the estimation accuracy, time complexity, and stopping criterion of the method. This proposal reformalizes our original method to address these three issues. Experiments for selecting the optimal parameter status of an SVM classifier over 15 datasets show that our improved method can achieve even higher selection reliability, with a reduction of time complexity by a factor exceeding 102 to 103 over the presented datasets.","PeriodicalId":342849,"journal":{"name":"2019 IEEE International Conference on Computational Electromagnetics (ICCEM)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improvement for Boundary-Uncertainty-Based Classifier Parameter Status Selection Method\",\"authors\":\"David Ha, Yuya Tomotoshi, Masahiro Senda, Hideyuki Watanabe, S. Katagiri, M. Ohsaki\",\"doi\":\"10.1109/COMPEM.2019.8779090\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose an improved version of our boundary-uncertainty-based method for selecting the optimal classifier parameter status that corresponds to the optimal Bayes boundary. Our original method could accurately estimate the optimal status on various real-life tasks. However, several tasks showed improvement room for the estimation accuracy, time complexity, and stopping criterion of the method. This proposal reformalizes our original method to address these three issues. Experiments for selecting the optimal parameter status of an SVM classifier over 15 datasets show that our improved method can achieve even higher selection reliability, with a reduction of time complexity by a factor exceeding 102 to 103 over the presented datasets.\",\"PeriodicalId\":342849,\"journal\":{\"name\":\"2019 IEEE International Conference on Computational Electromagnetics (ICCEM)\",\"volume\":\"78 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Conference on Computational Electromagnetics (ICCEM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMPEM.2019.8779090\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Conference on Computational Electromagnetics (ICCEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMPEM.2019.8779090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improvement for Boundary-Uncertainty-Based Classifier Parameter Status Selection Method
We propose an improved version of our boundary-uncertainty-based method for selecting the optimal classifier parameter status that corresponds to the optimal Bayes boundary. Our original method could accurately estimate the optimal status on various real-life tasks. However, several tasks showed improvement room for the estimation accuracy, time complexity, and stopping criterion of the method. This proposal reformalizes our original method to address these three issues. Experiments for selecting the optimal parameter status of an SVM classifier over 15 datasets show that our improved method can achieve even higher selection reliability, with a reduction of time complexity by a factor exceeding 102 to 103 over the presented datasets.