{"title":"一种可靠的MLC闪存存储系统MTD设计","authors":"Yuan-Hao Chang, Tei-Wei Kuo","doi":"10.1145/1879021.1879045","DOIUrl":null,"url":null,"abstract":"The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.","PeriodicalId":143573,"journal":{"name":"International Conference on Embedded Software","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"A reliable MTD design for MLC flash-memory storage systems\",\"authors\":\"Yuan-Hao Chang, Tei-Wei Kuo\",\"doi\":\"10.1145/1879021.1879045\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.\",\"PeriodicalId\":143573,\"journal\":{\"name\":\"International Conference on Embedded Software\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Embedded Software\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1879021.1879045\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Embedded Software","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1879021.1879045","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A reliable MTD design for MLC flash-memory storage systems
The reliability of flash-memory chips has dropped dramatically in recent years. In order to solve this problem, a reliable memory technology device (MTD) design is proposed to address this concern at the device driver layer so as to release the design complexity of flash-memory management software/firmware and to improve the maintainability and portability of flash management designs for existing and future products. The proposed design was evaluated through a series of experiments based on realistic traces to show that the proposed approach could significantly improve the reliability of flash memory with limited overheads.
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