二维阵列调制散射技术标定程序

P. Garreau, K. van't Klooster, J. Bolomey, D. Picard
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引用次数: 4

摘要

提出了一种提高二维调制散射阵列近场测量精度的标定技术。解释了二维阵列的振幅和相位的不均匀特性如何通过使用平面波照明对阵列进行单独评估来纠正。校准文件是通过测量ESTEC紧凑型天线测试范围提供的参考电场获得的。图中显示了校正前后锥体喇叭近场测量结果的比较
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modulated scattering techniques calibration procedure for a 2D array
The authors present a calibration technique for improving the accuracy of the near-field measurement with a 2D modulated scattering array. It is explained how the nonuniform characteristics in amplitude and in phase of a 2D array can be corrected by using a separate assessment of the array with a plane wave illumination. The calibration file is obtained by measuring a reference electric field provided by the ESTEC compact antenna test range. A comparison of a near-field measurement of a pyramidal horn is shown before and after such calibration.<>
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