{"title":"电力电子电路可靠性数值模拟分析","authors":"L. Kamas, S. Sanders","doi":"10.1109/CIPE.1994.396720","DOIUrl":null,"url":null,"abstract":"This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis.<<ETX>>","PeriodicalId":123138,"journal":{"name":"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Reliability analysis via numerical simulation of power electronic circuits\",\"authors\":\"L. Kamas, S. Sanders\",\"doi\":\"10.1109/CIPE.1994.396720\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis.<<ETX>>\",\"PeriodicalId\":123138,\"journal\":{\"name\":\"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CIPE.1994.396720\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE Workshop on Computers in Power Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIPE.1994.396720","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability analysis via numerical simulation of power electronic circuits
This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis.<>