{"title":"振荡冲击电压下短气隙阻挡的影响","authors":"R. Sarathi, C. S. Karri","doi":"10.1109/CEIDP.1997.641179","DOIUrl":null,"url":null,"abstract":"In this paper, the results of investigation carried out to understand the influence of barrier in a short air gap with the Rod-Rod configuration under oscillatory impulse voltages (UOIV, SBOIV, CBOIV) of different frequencies and dampings are presented. For the purpose of comparison, results obtained under AC, DC, LI and SI voltages are also provided.","PeriodicalId":176239,"journal":{"name":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Effect of barrier in short air gaps under oscillatory impulse voltages\",\"authors\":\"R. Sarathi, C. S. Karri\",\"doi\":\"10.1109/CEIDP.1997.641179\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the results of investigation carried out to understand the influence of barrier in a short air gap with the Rod-Rod configuration under oscillatory impulse voltages (UOIV, SBOIV, CBOIV) of different frequencies and dampings are presented. For the purpose of comparison, results obtained under AC, DC, LI and SI voltages are also provided.\",\"PeriodicalId\":176239,\"journal\":{\"name\":\"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1997.641179\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1997.641179","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effect of barrier in short air gaps under oscillatory impulse voltages
In this paper, the results of investigation carried out to understand the influence of barrier in a short air gap with the Rod-Rod configuration under oscillatory impulse voltages (UOIV, SBOIV, CBOIV) of different frequencies and dampings are presented. For the purpose of comparison, results obtained under AC, DC, LI and SI voltages are also provided.