半导体晶圆制造设备光刻区负载平衡问题的模拟解决方案

L. Mönch, Matthias Prause, Volker Schmalfuss
{"title":"半导体晶圆制造设备光刻区负载平衡问题的模拟解决方案","authors":"L. Mönch, Matthias Prause, Volker Schmalfuss","doi":"10.1109/WSC.2001.977430","DOIUrl":null,"url":null,"abstract":"Presents the results of a simulation study for the solution of load-balancing problems in a semiconductor wafer fabrication facility. In the bottleneck area of photolithography the steppers form several different subgroups. These subgroups differ, for example, in the size of the masks that have to be used for processing lots on the steppers of a single group. During lot release it is necessary to distribute the lots over the different stepper groups in such a way that global targets like cycle time minimization, the maximization of the number of finished lots and due date performance are inside a certain range. A simulation model of a wafer fab is given that models the, photolithography area in a detailed manner. By means of this simulation model it is possible to decide at release time on which stepper subgroup processing of the lots of a certain product is favorable.","PeriodicalId":275394,"journal":{"name":"Proceeding of the 2001 Winter Simulation Conference (Cat. No.01CH37304)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"Simulation-based solution of load-balancing problems in the photolithography area of a semiconductor wafer fabrication facility\",\"authors\":\"L. Mönch, Matthias Prause, Volker Schmalfuss\",\"doi\":\"10.1109/WSC.2001.977430\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents the results of a simulation study for the solution of load-balancing problems in a semiconductor wafer fabrication facility. In the bottleneck area of photolithography the steppers form several different subgroups. These subgroups differ, for example, in the size of the masks that have to be used for processing lots on the steppers of a single group. During lot release it is necessary to distribute the lots over the different stepper groups in such a way that global targets like cycle time minimization, the maximization of the number of finished lots and due date performance are inside a certain range. A simulation model of a wafer fab is given that models the, photolithography area in a detailed manner. By means of this simulation model it is possible to decide at release time on which stepper subgroup processing of the lots of a certain product is favorable.\",\"PeriodicalId\":275394,\"journal\":{\"name\":\"Proceeding of the 2001 Winter Simulation Conference (Cat. No.01CH37304)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-12-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceeding of the 2001 Winter Simulation Conference (Cat. No.01CH37304)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WSC.2001.977430\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceeding of the 2001 Winter Simulation Conference (Cat. No.01CH37304)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WSC.2001.977430","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 46

摘要

介绍了半导体晶圆制造设备中负载平衡问题的仿真研究结果。在光刻技术的瓶颈领域,步进器形成了几个不同的子组。例如,这些子组在处理单个组的步进器上的批次时必须使用的掩模大小不同。在批放行过程中,有必要将批分配到不同的步进组,以使周期时间最小化、完成批数量最大化和截止日期性能等全局目标在一定范围内。给出了一个晶圆厂的仿真模型,对光刻区域进行了详细的建模。利用该仿真模型,可以在放行时确定某批产品的哪一步进子群加工是有利的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simulation-based solution of load-balancing problems in the photolithography area of a semiconductor wafer fabrication facility
Presents the results of a simulation study for the solution of load-balancing problems in a semiconductor wafer fabrication facility. In the bottleneck area of photolithography the steppers form several different subgroups. These subgroups differ, for example, in the size of the masks that have to be used for processing lots on the steppers of a single group. During lot release it is necessary to distribute the lots over the different stepper groups in such a way that global targets like cycle time minimization, the maximization of the number of finished lots and due date performance are inside a certain range. A simulation model of a wafer fab is given that models the, photolithography area in a detailed manner. By means of this simulation model it is possible to decide at release time on which stepper subgroup processing of the lots of a certain product is favorable.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信