{"title":"利用BiCMOS技术设计带ESD保护电路的LVDS变送器","authors":"Yong-Seo Koo, Jo-Woon Lee, Jae-Hyun Lee, Kwang-Yeob Lee, Jae-Chang Kwak, Kui-Dong Kim","doi":"10.1109/ISSCS.2007.4292648","DOIUrl":null,"url":null,"abstract":"This paper presents the design of LVDS (low-voltage-differential-signaling) transmitter for Gb/s-per-pin operation using BiCMOS technology. To reduce chip area, LVDS transmitter's switching devices are replaced with lateral bipolar devices. Also the proposed LVDS transmitter is operated at 1.8 V power supply. Its maximum data rate is 2.8 Gb/s approximately. In addition, an ESD protection circuit is designed for ESD protection. This structure has low latch-up phenomenon by using turn on/off character of N-channel MOSFET and low triggering voltage by turning P-channel MOSFET in the SCR structure. The triggering voltage is simulated to 4.5 V-8 V as the variation of gate length. Finally, the high speed I/O interface circuit with the low triggered ESD protection device is designed in a single-chip.","PeriodicalId":225101,"journal":{"name":"2007 International Symposium on Signals, Circuits and Systems","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The Design of LVDS Transmitter with ESD Protection Circuit using BiCMOS Technologies\",\"authors\":\"Yong-Seo Koo, Jo-Woon Lee, Jae-Hyun Lee, Kwang-Yeob Lee, Jae-Chang Kwak, Kui-Dong Kim\",\"doi\":\"10.1109/ISSCS.2007.4292648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the design of LVDS (low-voltage-differential-signaling) transmitter for Gb/s-per-pin operation using BiCMOS technology. To reduce chip area, LVDS transmitter's switching devices are replaced with lateral bipolar devices. Also the proposed LVDS transmitter is operated at 1.8 V power supply. Its maximum data rate is 2.8 Gb/s approximately. In addition, an ESD protection circuit is designed for ESD protection. This structure has low latch-up phenomenon by using turn on/off character of N-channel MOSFET and low triggering voltage by turning P-channel MOSFET in the SCR structure. The triggering voltage is simulated to 4.5 V-8 V as the variation of gate length. Finally, the high speed I/O interface circuit with the low triggered ESD protection device is designed in a single-chip.\",\"PeriodicalId\":225101,\"journal\":{\"name\":\"2007 International Symposium on Signals, Circuits and Systems\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-07-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Symposium on Signals, Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCS.2007.4292648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Symposium on Signals, Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCS.2007.4292648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Design of LVDS Transmitter with ESD Protection Circuit using BiCMOS Technologies
This paper presents the design of LVDS (low-voltage-differential-signaling) transmitter for Gb/s-per-pin operation using BiCMOS technology. To reduce chip area, LVDS transmitter's switching devices are replaced with lateral bipolar devices. Also the proposed LVDS transmitter is operated at 1.8 V power supply. Its maximum data rate is 2.8 Gb/s approximately. In addition, an ESD protection circuit is designed for ESD protection. This structure has low latch-up phenomenon by using turn on/off character of N-channel MOSFET and low triggering voltage by turning P-channel MOSFET in the SCR structure. The triggering voltage is simulated to 4.5 V-8 V as the variation of gate length. Finally, the high speed I/O interface circuit with the low triggered ESD protection device is designed in a single-chip.