直写离子束辐照约瑟夫森结

E. Cho, Hao Li, S. Cybart
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引用次数: 0

摘要

我们强调了用聚焦氦离子束辐照制备的YBa2Cu3O7约瑟夫森结的电学性质的可重复性和控制水平。具体来说,我们展示了使用大范围辐照剂量制造的几个结的电输运性质的结果。在这个范围的下端,结表现出超导体-正常金属-超导体(SNS)约瑟夫森结的性质。然而,随着剂量的增加,有一个过渡到与超导体-绝缘体-超导体(SIS)结一致的电特性。为了研究大量氦离子约瑟夫森结的均匀性,我们制作了包含20个串联的SNS和SIS约瑟夫森结阵列。这些阵列的电输运特性显示出非常均匀的结,在临界电流或电阻下没有明显的扩散。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Direct-Write Ion Beam Irradiated Josephson Junctions
We highlight the reproducibility and level of control over the electrical properties of YBa2Cu3O7 Josephson junctions fabricated with irradiation from a focused helium ion beam. Specifically we show the results of electrical transport properties for several junctions fabricated using a large range of irradiation doses. At the lower end of this range, junctions exhibit superconductor-normal metal-superconductor (SNS) Josephson junction properties. However, as dose increases there is a transition to electrical characteristics consistent with superconductor-insulator-superconductor (SIS) junctions. To investigate the uniformity of large numbers of helium ion Josephson junctions we fabricate arrays of both SNS and SIS Josephson junctions containing 20 connected in series. Electrical transport properties for these arrays reveal very uniform junctions with no appreciable spread in critical current or resistance.
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