处理器核的预硅验证方法

2011 9th East-West Design & Test Symposium (EWDTS) Pub Date : 2011-09-09 DOI:10.1109/EWDTS.2011.6116581

S. Berdyshev, V. Boykov, Y. Gimpilevich, Yuri Iskiv, Gilad Keren, Denis Muratov, Igor Smirnov, V. Vertegel

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引用次数: 0

摘要

介绍了处理器内核预硅验证的实践经验。所提出的方法给出了良好的结果，良好的覆盖率，并且需要较短的验证时间。

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Methodology of the pre-silicon verification of the processor core

Practical experience of pre-silicon verification of the processor core is presented. The proposed methodology gives good results, good coverage, and requires a short verification time period.

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2011 9th East-West Design & Test Symposium (EWDTS)

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