Galois型LFSR伪随机数并发生成

2013 11th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services (TELSIKS) Pub Date : 2013-10-01 DOI:10.1109/TELSKS.2013.6704893

E. Milovanovic, I. Milovanovic, M. Stojcev

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引用次数: 3

摘要

本文研究了并行测试模式生成的实现，并将其作为内置自测试(BIST)设计的基本构件。所提出的设计可以在一个复杂的VLSI集成电路中驱动多个被测电路(CUT)。对于并行测试模式的生成，使用伽罗瓦型LFSR。描述了并发伪随机数(PRN)生成的数学过程。我们实现了一个LFSR，它并行生成两个prn。所实现的加速在1.33到2之间，这取决于所使用的原始多项式的特性。

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Concurrent generation of pseudo random numbers with LFSR of Galois type

In this paper we consider the implementation of parallel test patterns generation which is used as a basic building block in built-in-self test (BIST) design. The proposed design can drive several circuits under test (CUT) within a complex VLSI IC. For parallel test pattern generation a LFSR of Galois type is used. Mathematical procedure for concurrent pseudo random number (PRN) generation is described. We have implemented a LFSR that generates two PRNs in parallel. The achieved speed up is between 1.33 and 2, and depends on the characteristics of used primitive polynomial.

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2013 11th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services (TELSIKS)

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