用于分析RTN对SRAM余量变化影响的Richardson-Lucy反褶积问题的解决技术

H. Yamauchi, Worawit Somha
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引用次数: 8

摘要

本文阐述了Richardson-Lucy (R-L)反卷积技术在分析随机电报噪声(RTN)对SRAM余量调制的影响时存在的问题,并提出了解决这些问题的技术。与基于R-L的反褶积不同,由于消除了任何微分和除法操作,该技术成功地避免了振铃误差的问题。通过将其应用于RTN对整体SRAM裕度变化的影响的实际分析,首次证明了这种有效性。实验结果表明,该方法可以将RTN反卷积的相对误差分别降低1014倍和104倍。这使得RTN与随机掺杂波动(RDF)卷积的cdf误差(即失败位计数误差)比传统算法减少了10个数量级。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A technique to solve issue of Richardson-Lucy deconvolution for analyzing RTN effects on SRAM margin variation
This paper demonstrates the issues of Richardson-Lucy (R-L) deconvolution technique when applying it to analyze the Random Telegraph Noise (RTN) effects on SRAM margin modulation and proposes the techniques to address the issues. Unlike the R-L based deconvolution, the proposed technique successfully circumvents the issue of ringing error thanks to eliminating any operations of differential and division. This effectiveness has been demonstrated for the first time with applying it to a real analysis for the effects of the RTN on the overall SRAM margin variations. It has been shown that the proposed technique can reduce its relative errors of the RTN deconvolution by 1014 and 104 times compared with the cases of the R-L and without segmentation, respectively. This enables to reduce the cdf error of the convolution of the RTN with the Random Dopant Fluctuation (RDF) (i.e., fail-bit-count error) by 10-orders of magnitude of the conventional algorithm.
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