{"title":"放电过程中六氟化硫的光谱分析","authors":"H. Hiziroglu, M. Sainz, D. Coleman, A. Qureshi","doi":"10.1109/EIC.1982.7464456","DOIUrl":null,"url":null,"abstract":"In order to better understand breakdown mechanisms and to determine the decomposition products of sulphur hexafluoride, a time-, space-, wavelength-resolved spectroscopic technique is used. Initial results derived from spectrometric analysis of sulphur hexafluoride discharges are presented and discussed.","PeriodicalId":422317,"journal":{"name":"1982 IEEE International Conference on Electrical Insulation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spectrometric analysis of sulphur hexafluoride during an electrical discharge\",\"authors\":\"H. Hiziroglu, M. Sainz, D. Coleman, A. Qureshi\",\"doi\":\"10.1109/EIC.1982.7464456\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to better understand breakdown mechanisms and to determine the decomposition products of sulphur hexafluoride, a time-, space-, wavelength-resolved spectroscopic technique is used. Initial results derived from spectrometric analysis of sulphur hexafluoride discharges are presented and discussed.\",\"PeriodicalId\":422317,\"journal\":{\"name\":\"1982 IEEE International Conference on Electrical Insulation\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1982 IEEE International Conference on Electrical Insulation\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIC.1982.7464456\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Conference on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.1982.7464456","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spectrometric analysis of sulphur hexafluoride during an electrical discharge
In order to better understand breakdown mechanisms and to determine the decomposition products of sulphur hexafluoride, a time-, space-, wavelength-resolved spectroscopic technique is used. Initial results derived from spectrometric analysis of sulphur hexafluoride discharges are presented and discussed.
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