纳米时代的低压嵌入式ram

T. Kawahara
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引用次数: 2

摘要

描述了低电压纳米级嵌入式RAM电池。首先,从电池尺寸、MOS晶体管的阈值电压和信号电荷方面对低压RAM电池进行了比较。其次,研究了6T和4T SRAM电池扩大电压裕度的解决方案,特别是介绍了后门控制的薄埋氧化全耗尽SOI的优势。然后,从提高保持时间和低电压工作性能的角度讨论了采用新型双电池的DRAM方法。这些低电压电池技术是未来嵌入式ram的有希望的候选者。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-voltage embedded RAMs in the nanometer era
Low-voltage nanometer-scale embedded RAM cells are described. First, low-voltage RAM cells are compared in terms of cell size, threshold voltage for MOS transistor, and signal charge. Second, the solution for 6T and 4T SRAM cells to widen the voltage margin are investigated, especially the advantages with a back-gate controlled thin buried-oxide fully-depleted SOI are presented. Then, DRAM approach with a novel twin- cell is discussed in terms of improving the retention time and low-voltage operation. These low-voltage cell technologies are the promising candidates for future embedded RAMs.
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