{"title":"平面结构中的δ - 1噪声","authors":"P. Clouser","doi":"10.1109/STIER.1988.95470","DOIUrl":null,"url":null,"abstract":"Three planar Delta-I noise models are identified and quantified: a first-order system developed from a radial transmission line; a second-order system developed from lumped elements; and internal reflection developed from a uniform transmission line. The proposed technique is derived from a combination of experimental measurements and theoretical analyses in which the Delta-I noise is divided into self, adjacent, and remote components. Emphasis is placed on understanding the underlying physical mechanisms of the Delta-I noise in specific experimental cases Values measured at 1 MHz on printed circuit board structures have yielded the power plane capacitance, signal line capacitance, and signal line inductance values used to calculate and understand the effects of nanosecond and subnanosecond pulses on those structures.<<ETX>>","PeriodicalId":356590,"journal":{"name":"Proceedings of the IEEE Southern Tier Technical Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Delta-I noise in planar structures\",\"authors\":\"P. Clouser\",\"doi\":\"10.1109/STIER.1988.95470\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Three planar Delta-I noise models are identified and quantified: a first-order system developed from a radial transmission line; a second-order system developed from lumped elements; and internal reflection developed from a uniform transmission line. The proposed technique is derived from a combination of experimental measurements and theoretical analyses in which the Delta-I noise is divided into self, adjacent, and remote components. Emphasis is placed on understanding the underlying physical mechanisms of the Delta-I noise in specific experimental cases Values measured at 1 MHz on printed circuit board structures have yielded the power plane capacitance, signal line capacitance, and signal line inductance values used to calculate and understand the effects of nanosecond and subnanosecond pulses on those structures.<<ETX>>\",\"PeriodicalId\":356590,\"journal\":{\"name\":\"Proceedings of the IEEE Southern Tier Technical Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE Southern Tier Technical Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STIER.1988.95470\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE Southern Tier Technical Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STIER.1988.95470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Three planar Delta-I noise models are identified and quantified: a first-order system developed from a radial transmission line; a second-order system developed from lumped elements; and internal reflection developed from a uniform transmission line. The proposed technique is derived from a combination of experimental measurements and theoretical analyses in which the Delta-I noise is divided into self, adjacent, and remote components. Emphasis is placed on understanding the underlying physical mechanisms of the Delta-I noise in specific experimental cases Values measured at 1 MHz on printed circuit board structures have yielded the power plane capacitance, signal line capacitance, and signal line inductance values used to calculate and understand the effects of nanosecond and subnanosecond pulses on those structures.<>