{"title":"双栅n沟道无结晶体管的输运特性","authors":"T. Paul, Q. Khosru","doi":"10.1109/ICECE.2016.7853938","DOIUrl":null,"url":null,"abstract":"In this work, Electrostatic and transport characteristics of symmetric double gate n-channel junctionless transistor have been investigated through numerical simulation. A 1-D self consistent analysis of coupled Schrodinger-Poisson equation has been performed. Channel mobile charge density has been obtained and studied for variations in device dimensions and biasing voltages. A simplified ballistic transport assumption has been applied to show the variations of drain current with device parameters. Finally transconductance has been extracted with respect to biasing gate voltage.","PeriodicalId":122930,"journal":{"name":"2016 9th International Conference on Electrical and Computer Engineering (ICECE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transport characteristics of double gate n-channel junctionless transistor\",\"authors\":\"T. Paul, Q. Khosru\",\"doi\":\"10.1109/ICECE.2016.7853938\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, Electrostatic and transport characteristics of symmetric double gate n-channel junctionless transistor have been investigated through numerical simulation. A 1-D self consistent analysis of coupled Schrodinger-Poisson equation has been performed. Channel mobile charge density has been obtained and studied for variations in device dimensions and biasing voltages. A simplified ballistic transport assumption has been applied to show the variations of drain current with device parameters. Finally transconductance has been extracted with respect to biasing gate voltage.\",\"PeriodicalId\":122930,\"journal\":{\"name\":\"2016 9th International Conference on Electrical and Computer Engineering (ICECE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 9th International Conference on Electrical and Computer Engineering (ICECE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECE.2016.7853938\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 9th International Conference on Electrical and Computer Engineering (ICECE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECE.2016.7853938","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transport characteristics of double gate n-channel junctionless transistor
In this work, Electrostatic and transport characteristics of symmetric double gate n-channel junctionless transistor have been investigated through numerical simulation. A 1-D self consistent analysis of coupled Schrodinger-Poisson equation has been performed. Channel mobile charge density has been obtained and studied for variations in device dimensions and biasing voltages. A simplified ballistic transport assumption has been applied to show the variations of drain current with device parameters. Finally transconductance has been extracted with respect to biasing gate voltage.