{"title":"ADC误差源的累积特性及其在时间交错ADC中的应用","authors":"C. Parkey, W. Mikhael, D. Chester","doi":"10.1109/MWSCAS.2012.6292229","DOIUrl":null,"url":null,"abstract":"The problem of characterizing transfer functions of Analog to Digital Converters (ADC) for use in compensation of Time Interleaved Analog to Digital Converters (TIADC) is ubiquitous in the area of mismatch correction algorithms. Identifying, classifying, and quantifying the presence of errors in ADCs and TIADCs is fundamental in the pursuit of correcting these errors. This problem, characterization of error effects, is investigated through calculation of higher order cumulants on the error signals of each type of system. The concept of cumulant calculation and interpretation is presented and applied to varying error environments and input signals.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs\",\"authors\":\"C. Parkey, W. Mikhael, D. Chester\",\"doi\":\"10.1109/MWSCAS.2012.6292229\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The problem of characterizing transfer functions of Analog to Digital Converters (ADC) for use in compensation of Time Interleaved Analog to Digital Converters (TIADC) is ubiquitous in the area of mismatch correction algorithms. Identifying, classifying, and quantifying the presence of errors in ADCs and TIADCs is fundamental in the pursuit of correcting these errors. This problem, characterization of error effects, is investigated through calculation of higher order cumulants on the error signals of each type of system. The concept of cumulant calculation and interpretation is presented and applied to varying error environments and input signals.\",\"PeriodicalId\":324891,\"journal\":{\"name\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2012.6292229\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2012.6292229","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Cumulant characterizations of ADC error sources with applications to Time Interleaved ADCs
The problem of characterizing transfer functions of Analog to Digital Converters (ADC) for use in compensation of Time Interleaved Analog to Digital Converters (TIADC) is ubiquitous in the area of mismatch correction algorithms. Identifying, classifying, and quantifying the presence of errors in ADCs and TIADCs is fundamental in the pursuit of correcting these errors. This problem, characterization of error effects, is investigated through calculation of higher order cumulants on the error signals of each type of system. The concept of cumulant calculation and interpretation is presented and applied to varying error environments and input signals.