{"title":"半绝缘系统中的低频色散","authors":"A. K. Jonscher","doi":"10.1109/CEIDP.1986.7726425","DOIUrl":null,"url":null,"abstract":"At sufficiently high temperatures all insulators tend to become semi-insulating due to increasing numbers of slowly mobile charges. The dielectric properties of such materials show a characteristic \"signature\" called low-frequency dispersion (LFD) differing drastically from direct current (dc) conduct in parallel with a capacitor and also from the Maxwell-Wagner process (MW) which in effect represents a series combination of a resistor Ro and a capacitor C0.","PeriodicalId":354533,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low-frequency dispersion in semi-insulating systems\",\"authors\":\"A. K. Jonscher\",\"doi\":\"10.1109/CEIDP.1986.7726425\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"At sufficiently high temperatures all insulators tend to become semi-insulating due to increasing numbers of slowly mobile charges. The dielectric properties of such materials show a characteristic \\\"signature\\\" called low-frequency dispersion (LFD) differing drastically from direct current (dc) conduct in parallel with a capacitor and also from the Maxwell-Wagner process (MW) which in effect represents a series combination of a resistor Ro and a capacitor C0.\",\"PeriodicalId\":354533,\"journal\":{\"name\":\"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1986.7726425\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1986.7726425","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low-frequency dispersion in semi-insulating systems
At sufficiently high temperatures all insulators tend to become semi-insulating due to increasing numbers of slowly mobile charges. The dielectric properties of such materials show a characteristic "signature" called low-frequency dispersion (LFD) differing drastically from direct current (dc) conduct in parallel with a capacitor and also from the Maxwell-Wagner process (MW) which in effect represents a series combination of a resistor Ro and a capacitor C0.