基于改进随机漫步方法的高产Mmic设计

AMPC Asia-Pacific Microwave Conference, Pub Date : 1992-08-11 DOI:10.1109/APMC.1992.672045

Y. Wang, L. Zhu

{"title":"基于改进随机漫步方法的高产Mmic设计","authors":"Y. Wang, L. Zhu","doi":"10.1109/APMC.1992.672045","DOIUrl":null,"url":null,"abstract":"~n tius parer, the traauonai ration! wa~ appmch fcr yield optmmtun IS mmfixi tc! fmhee-r mpmve its efficiency. ?lie or*&ogonai army rd experment desw 1s empioyed as an alternative tc generaw sample pmts m the crmt parameter space. In addluon the step of the random walK IS mafled to be a&pt. FmaUy, an exmpie IS even to show its efficiency.","PeriodicalId":234490,"journal":{"name":"AMPC Asia-Pacific Microwave Conference,","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"High Yield Mmic Design Using Improved Random Walk Approach\",\"authors\":\"Y. Wang, L. Zhu\",\"doi\":\"10.1109/APMC.1992.672045\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"~n tius parer, the traauonai ration! wa~ appmch fcr yield optmmtun IS mmfixi tc! fmhee-r mpmve its efficiency. ?lie or*&ogonai army rd experment desw 1s empioyed as an alternative tc generaw sample pmts m the crmt parameter space. In addluon the step of the random walK IS mafled to be a&pt. FmaUy, an exmpie IS even to show its efficiency.\",\"PeriodicalId\":234490,\"journal\":{\"name\":\"AMPC Asia-Pacific Microwave Conference,\",\"volume\":\"93 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-08-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AMPC Asia-Pacific Microwave Conference,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APMC.1992.672045\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AMPC Asia-Pacific Microwave Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.1992.672045","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~应用最优产量的方法是mmfix等。Fmhee-r提高其效率。在CRMT参数空间中，采用了一种替代普通样本PMTS的新方法。在adluon中，随机漫步的步长被定义为a&pt。现在，甚至可以举个例子来说明它的效率。

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High Yield Mmic Design Using Improved Random Walk Approach

~n tius parer, the traauonai ration! wa~ appmch fcr yield optmmtun IS mmfixi tc! fmhee-r mpmve its efficiency. ?lie or*&ogonai army rd experment desw 1s empioyed as an alternative tc generaw sample pmts m the crmt parameter space. In addluon the step of the random walK IS mafled to be a&pt. FmaUy, an exmpie IS even to show its efficiency.

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AMPC Asia-Pacific Microwave Conference,

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