{"title":"关于评价微处理器可靠性的问题","authors":"S. Evdokimova, Yunlong Wu","doi":"10.34220/mamsp_38-43","DOIUrl":null,"url":null,"abstract":"The paper considers the trends in the development of foreign microprocessors for comput-ers. Special attention is paid to a series of high-performance Loongson processors manufactured in China. The reliability indicators of processors and models for calculating the operational failure rate are given.","PeriodicalId":113054,"journal":{"name":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"ON THE QUESTION OF EVALUATING THE RELIABILITY OF MICROPROCESSORS\",\"authors\":\"S. Evdokimova, Yunlong Wu\",\"doi\":\"10.34220/mamsp_38-43\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper considers the trends in the development of foreign microprocessors for comput-ers. Special attention is paid to a series of high-performance Loongson processors manufactured in China. The reliability indicators of processors and models for calculating the operational failure rate are given.\",\"PeriodicalId\":113054,\"journal\":{\"name\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.34220/mamsp_38-43\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.34220/mamsp_38-43","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ON THE QUESTION OF EVALUATING THE RELIABILITY OF MICROPROCESSORS
The paper considers the trends in the development of foreign microprocessors for comput-ers. Special attention is paid to a series of high-performance Loongson processors manufactured in China. The reliability indicators of processors and models for calculating the operational failure rate are given.