脑电图标志的自动分析

K. Cheng, Yen-Ting Chen, Jia-Kuang Liu
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引用次数: 1

摘要

脑电图上的地标是那些代表颅骨实际解剖结构的地标。这些点被正畸医生用于诊断和治疗计划。在本研究中,采用台式扫描仪的微机系统自动定位x射线头片的标志。首先,对数字化的脑电图图像进行处理,确定一个参考点进行分析,并将其划分为几个矩形子图像(如额、眶、mda、下颌骨等)。这些区域包含所有有用的标志,然后在预处理阶段增强。采用金字塔法降低图像分辨率,采用合适的边缘检测器或最佳方向边缘检测器检测边缘。曲线。用预先存储的模型对每条边进行弹性修正。最后,该方法可以立即定位到标志的位置,并计算出相关参数进行诊断。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automatic Analysis Of Landmarks In Cephalograms
Landmarks on the cephalograms are those representing the actual anatomic structures of the skull. These points are used by orthodontists for diagnosis and treatment planning. In this study, a microcomputer system with a desk-top scanner was employed for locating the landmarks of X-ray cephalogram automatidy. Fustly, the digitized image of cephalogram is processed to define a reference point for analysis, and divided into several rectangular subimages (such as frontal, orbit, mda, mandible,...). These regions containing all the useful landmarks are then enhanced in the preprocessing stage. The pyramid method is used to reduce the resolution of image, and the edges are detected by the appropriate edge detectors or the best orientation edge detector. The curve. of each edge is corrected elastically with the pre-stored models. Finally, positions of landmarks could be located immediately and the associated paremeters could also be computed for diagnosis.
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