{"title":"外延垂直围栅mosfet中的SiGe异质结","authors":"C. Date, J. Plummer","doi":"10.1109/VLSIT.2000.852759","DOIUrl":null,"url":null,"abstract":"Vertical MOSFETs are possible future architectures for memory cells as well as alternatives for conventional CMOS devices. The vertical channel allows growth of epitaxial structures, such as heterostructures, before the pillars are etched. We show how incorporation of SiGe heterostructures in vertical MOSFET devices can be used to delay the floating body effect or to modify hot carrier characteristics.","PeriodicalId":268624,"journal":{"name":"2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"SiGe heterojunctions in epitaxial vertical surrounding-gate MOSFETs\",\"authors\":\"C. Date, J. Plummer\",\"doi\":\"10.1109/VLSIT.2000.852759\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Vertical MOSFETs are possible future architectures for memory cells as well as alternatives for conventional CMOS devices. The vertical channel allows growth of epitaxial structures, such as heterostructures, before the pillars are etched. We show how incorporation of SiGe heterostructures in vertical MOSFET devices can be used to delay the floating body effect or to modify hot carrier characteristics.\",\"PeriodicalId\":268624,\"journal\":{\"name\":\"2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIT.2000.852759\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2000.852759","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SiGe heterojunctions in epitaxial vertical surrounding-gate MOSFETs
Vertical MOSFETs are possible future architectures for memory cells as well as alternatives for conventional CMOS devices. The vertical channel allows growth of epitaxial structures, such as heterostructures, before the pillars are etched. We show how incorporation of SiGe heterostructures in vertical MOSFET devices can be used to delay the floating body effect or to modify hot carrier characteristics.