{"title":"一种多线材料参数提取方法","authors":"H. Sillanpaa, A. Rasku, R. Makinen","doi":"10.1109/MMW.2010.5605167","DOIUrl":null,"url":null,"abstract":"Material characterization is an important part of printable electronics design since material properties depend strongly on the manufacturing process. This paper introduces a novel multiline material characterization method that is applicable to the characterization of printable electronics structures as well as integrated microwave devices. The proposed technique eliminates the half-wave resonances, decrease the sensitivity to small variations in the lines and provide a weighted average from individual line pair data. The multiline extraction method is validated using full-wave simulation data, and is subsequently applied to test structures manufactured with inkjet technology.","PeriodicalId":145274,"journal":{"name":"2010 10th Mediterranean Microwave Symposium","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"A multiline material parameter extraction method\",\"authors\":\"H. Sillanpaa, A. Rasku, R. Makinen\",\"doi\":\"10.1109/MMW.2010.5605167\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Material characterization is an important part of printable electronics design since material properties depend strongly on the manufacturing process. This paper introduces a novel multiline material characterization method that is applicable to the characterization of printable electronics structures as well as integrated microwave devices. The proposed technique eliminates the half-wave resonances, decrease the sensitivity to small variations in the lines and provide a weighted average from individual line pair data. The multiline extraction method is validated using full-wave simulation data, and is subsequently applied to test structures manufactured with inkjet technology.\",\"PeriodicalId\":145274,\"journal\":{\"name\":\"2010 10th Mediterranean Microwave Symposium\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 10th Mediterranean Microwave Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MMW.2010.5605167\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 10th Mediterranean Microwave Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MMW.2010.5605167","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Material characterization is an important part of printable electronics design since material properties depend strongly on the manufacturing process. This paper introduces a novel multiline material characterization method that is applicable to the characterization of printable electronics structures as well as integrated microwave devices. The proposed technique eliminates the half-wave resonances, decrease the sensitivity to small variations in the lines and provide a weighted average from individual line pair data. The multiline extraction method is validated using full-wave simulation data, and is subsequently applied to test structures manufactured with inkjet technology.
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