{"title":"激光辅助原子探针:非金属材料的分析","authors":"M. Gilbert, B. Deconihout","doi":"10.1109/IVNC.2006.335422","DOIUrl":null,"url":null,"abstract":"Laser assisted atom probe technique is reported which differs from the conventional atom probe analysis in the use of ultra fast sub nanosecond laser pulses instead of electrical evaporation pulsed. This method proves to be advantageous in analyzing oxide type materials like manganites, superconductors and even in the conducting phase of highly resistant silicon","PeriodicalId":108834,"journal":{"name":"2006 19th International Vacuum Nanoelectronics Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Laser Assisted Atom Probe: Toward the Analyze of Non-Metallic Material\",\"authors\":\"M. Gilbert, B. Deconihout\",\"doi\":\"10.1109/IVNC.2006.335422\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Laser assisted atom probe technique is reported which differs from the conventional atom probe analysis in the use of ultra fast sub nanosecond laser pulses instead of electrical evaporation pulsed. This method proves to be advantageous in analyzing oxide type materials like manganites, superconductors and even in the conducting phase of highly resistant silicon\",\"PeriodicalId\":108834,\"journal\":{\"name\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 19th International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2006.335422\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 19th International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2006.335422","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Laser Assisted Atom Probe: Toward the Analyze of Non-Metallic Material
Laser assisted atom probe technique is reported which differs from the conventional atom probe analysis in the use of ultra fast sub nanosecond laser pulses instead of electrical evaporation pulsed. This method proves to be advantageous in analyzing oxide type materials like manganites, superconductors and even in the conducting phase of highly resistant silicon