用光吸收技术绘制离子风作用下液体薄膜的厚度

D. Testi
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引用次数: 0

摘要

本文阐述了一种光度测定技术,其目的是获得受日冕风影响的液膜厚度图。通过添加染料的液体层发生的光吸收被用来评估其厚度。该层从湿壁的背面照射,并通过数码相机测量透射光强。原始强度场的不均匀性建议为每个测量点建立校准曲线。详细描述了将测量光强转换为厚度场所需的滤波和插值过程。该技术经济且无侵入性。它可以确定局部膜厚度,精度低于测量范围的10%。举例说明了在离子风作用下,在不同状态和不同波浪形下的液体厚度图的应用。研究这种现象特别有趣,因为电流低于1毫安的离子风可以在液/气界面上产生额外的波和涟漪,因此,在实际应用中,它可以增加两相之间的质量和热量传递,而能量消耗可以忽略不计。在有和没有产生电晕风的情况下,用细导线测量下降膜的厚度。可以在整个照射区域观察到表面波纹的模式,并且可以在施加的高压的两个极性下评估对表面波纹的有益影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mapping the Thickness of Falling Liquid Films under Ionic Wind by a Light Absorption Technique
The paper shows the elaboration of a photometric technique with the purpose of obtaining thickness maps of liquid films, subject to corona wind. Light absorption occurring through a liquid layer with the addition of dyestuff is used to evaluate its thickness. The layer is illuminated from the back of the wetted wall and the transiting light intensity is measured by means of a digital camera. Non-uniformities in the original intensity field suggest building a calibration curve for each measurement point. The filtering and interpolation procedure necessary to transform the measured light intensity into the thickness field is described in detail. The technique is economical and non-intrusive. It can determine the local film thickness with an accuracy below 10 % of the measuring range. Application to obtaining a liquid thickness map for falling films under ionic wind in different regimes and at different waviness is illustrated. It is particularly interesting to study this phenomenon, since an ionic wind, with electrical currents lower than 1 mA, can create additional waves and ripples on the liquid/gas interface, thus, in practical applications, it increases mass and heat transfer between the two phases with a negligible energy expense. The thickness of the falling film is measured with and without the generation of corona wind by a thin wire. The pattern of surface ripples can be observed over the entire illuminated area and the beneficial effect on surface waviness can be evaluated at both polarities of the applied high voltage.
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