基于65nm CMOS的门级流水线2.97GHz自同步FPGA

B. Devlin, M. Ikeda, K. Asada
{"title":"基于65nm CMOS的门级流水线2.97GHz自同步FPGA","authors":"B. Devlin, M. Ikeda, K. Asada","doi":"10.1109/ASPDAC.2011.5722288","DOIUrl":null,"url":null,"abstract":"We have designed and measured the performance against power supply bounce and aging of a Self Synchronous FPGA (SSFPGA) in 65nm CMOS which achieves 2.97GHz throughput at 1.2V. The proposed SSFPGA employs a 38×38 array of 4-input, 3-stage Self Synchronous Configurable Logic Blocks (SSCLB), with the introduction of a new dual tree-divider 4 input LUT to achieve a 4.5× throughput improvement over our previous model [1]. Energy was measured at 3.23 pJ/block/cycle using a custom built board. We measured the SSFPGA for aging with accelerated degradation and results show the SSFPGA has 8% longer time margin before chip malfunctions compared to a Synchronous FPGA.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A gate-level pipelined 2.97GHz Self Synchronous FPGA in 65nm CMOS\",\"authors\":\"B. Devlin, M. Ikeda, K. Asada\",\"doi\":\"10.1109/ASPDAC.2011.5722288\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have designed and measured the performance against power supply bounce and aging of a Self Synchronous FPGA (SSFPGA) in 65nm CMOS which achieves 2.97GHz throughput at 1.2V. The proposed SSFPGA employs a 38×38 array of 4-input, 3-stage Self Synchronous Configurable Logic Blocks (SSCLB), with the introduction of a new dual tree-divider 4 input LUT to achieve a 4.5× throughput improvement over our previous model [1]. Energy was measured at 3.23 pJ/block/cycle using a custom built board. We measured the SSFPGA for aging with accelerated degradation and results show the SSFPGA has 8% longer time margin before chip malfunctions compared to a Synchronous FPGA.\",\"PeriodicalId\":316253,\"journal\":{\"name\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2011.5722288\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722288","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

我们设计并测量了65nm CMOS自同步FPGA (SSFPGA)的电源反弹和老化性能,该FPGA在1.2V下实现了2.97GHz的吞吐量。提出的SSFPGA采用38×38 4输入,3级自同步可配置逻辑块(SSCLB)阵列,引入了新的双树分频4输入LUT,以实现比我们以前的模型提高4.5倍的吞吐量[1]。使用定制板测量能量为3.23 pJ/块/循环。我们测量了SSFPGA的老化和加速退化,结果表明,与同步FPGA相比,SSFPGA在芯片故障前的时间裕度延长了8%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A gate-level pipelined 2.97GHz Self Synchronous FPGA in 65nm CMOS
We have designed and measured the performance against power supply bounce and aging of a Self Synchronous FPGA (SSFPGA) in 65nm CMOS which achieves 2.97GHz throughput at 1.2V. The proposed SSFPGA employs a 38×38 array of 4-input, 3-stage Self Synchronous Configurable Logic Blocks (SSCLB), with the introduction of a new dual tree-divider 4 input LUT to achieve a 4.5× throughput improvement over our previous model [1]. Energy was measured at 3.23 pJ/block/cycle using a custom built board. We measured the SSFPGA for aging with accelerated degradation and results show the SSFPGA has 8% longer time margin before chip malfunctions compared to a Synchronous FPGA.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信