{"title":"片上生成和评估模拟测试信号的实用测试内核:应用于模拟BIST的网络/频谱分析仪","authors":"M. Barragán, D. Vázquez, A. Rueda","doi":"10.1109/RME.2009.5201327","DOIUrl":null,"url":null,"abstract":"This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.","PeriodicalId":245992,"journal":{"name":"2009 Ph.D. Research in Microelectronics and Electronics","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Practical test cores for the on-chip generation and evaluation of analog test signals: Application to a network/spectrum analyzer for analog BIST\",\"authors\":\"M. Barragán, D. Vázquez, A. Rueda\",\"doi\":\"10.1109/RME.2009.5201327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.\",\"PeriodicalId\":245992,\"journal\":{\"name\":\"2009 Ph.D. Research in Microelectronics and Electronics\",\"volume\":\"70 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Ph.D. Research in Microelectronics and Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RME.2009.5201327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Ph.D. Research in Microelectronics and Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RME.2009.5201327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Practical test cores for the on-chip generation and evaluation of analog test signals: Application to a network/spectrum analyzer for analog BIST
This paper presents practical implementations of test cores for analog and mixed-signal BIST. A sinewave generator for test stimulus generation, and a periodical signal characterization system for response evaluation are discussed. Integrated prototypes and experimental results are provided, and a prototype of a network/spectrum analyzer featuring both test cores has been developed and tested in the lab.
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