应变对扭曲石墨烯层器件电子性能的影响

V. Nguyen, J. Saint-Martin, P. Dollfus, Huy V. Nguyen
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引用次数: 0

摘要

采用原子模拟的方法研究了单轴应变对扭曲石墨烯双层结构电子和输运性质的影响。结果表明,应变诱导的能带结构调制可以打破简并并调制van Hove奇点的位置。甚至可以观察到大范围扭转角的低能量鞍点。结果还表明,应变引起的两个晶格狄拉克点的分离可以在几个百分点的小应变下产生几百meV的有限输运间隙。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Strain effects on the electronic properties of devices made of twisted graphene layers
The effects of uniaxial strain on the electronic and transport properties of twisted graphene bilayer structures are investigated by means of atomistic simulation. It is shown that the strain-induced modulation of band structure makes it possible to break the degeneracy and to modulate the position van Hove singularities. It is even possible to observe low-energy saddle points for a large range of twist angles. It is shown also that the strain-induced separation of Dirac points of the two lattices may generate a finite transport gap as large as a few hundreds of meV for a small strain of a few percent.
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