{"title":"电阳极氧化法制备TiO2纳米管的结构与形态","authors":"J. Mbese, Ziy, A. Madikizela","doi":"10.4172/2169-0022.1000509","DOIUrl":null,"url":null,"abstract":"Electro-anodization of thin Ti film deposited on glass substrate by RF sputtering technique was employed to fabricate TiO2 Nanotubes (TNTs) annealed from 350°C to 650°C. The morphological analysis were done using Scanning Electron Microscopy (SEM), which showed the change in the surface morphology with increase in annealing temperature. The structural analysis was performed using X-ray Diffraction (XRD) and Raman spectroscopy. XRD revealed the presence of anatase phase TiO2 with most intense anatase peak found at 550°C, at 2θ of 28, 9° (101). Raman revealed the presence of only anatase phase of TiO2, and showed well-improved crystallinity of the TNTs upon increasing in annealing temperature.","PeriodicalId":383125,"journal":{"name":"Journal of Material Science & Engineering","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural and Morphological Properties of TiO2 Nanotubes Fabricated via Electro-anodization Process\",\"authors\":\"J. Mbese, Ziy, A. Madikizela\",\"doi\":\"10.4172/2169-0022.1000509\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electro-anodization of thin Ti film deposited on glass substrate by RF sputtering technique was employed to fabricate TiO2 Nanotubes (TNTs) annealed from 350°C to 650°C. The morphological analysis were done using Scanning Electron Microscopy (SEM), which showed the change in the surface morphology with increase in annealing temperature. The structural analysis was performed using X-ray Diffraction (XRD) and Raman spectroscopy. XRD revealed the presence of anatase phase TiO2 with most intense anatase peak found at 550°C, at 2θ of 28, 9° (101). Raman revealed the presence of only anatase phase of TiO2, and showed well-improved crystallinity of the TNTs upon increasing in annealing temperature.\",\"PeriodicalId\":383125,\"journal\":{\"name\":\"Journal of Material Science & Engineering\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Material Science & Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4172/2169-0022.1000509\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Material Science & Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4172/2169-0022.1000509","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structural and Morphological Properties of TiO2 Nanotubes Fabricated via Electro-anodization Process
Electro-anodization of thin Ti film deposited on glass substrate by RF sputtering technique was employed to fabricate TiO2 Nanotubes (TNTs) annealed from 350°C to 650°C. The morphological analysis were done using Scanning Electron Microscopy (SEM), which showed the change in the surface morphology with increase in annealing temperature. The structural analysis was performed using X-ray Diffraction (XRD) and Raman spectroscopy. XRD revealed the presence of anatase phase TiO2 with most intense anatase peak found at 550°C, at 2θ of 28, 9° (101). Raman revealed the presence of only anatase phase of TiO2, and showed well-improved crystallinity of the TNTs upon increasing in annealing temperature.
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