Mg掺杂对银钯合金低接触电阻开关触头寿命的影响

T. Tamai, A. Sato, S. Ito
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引用次数: 3

摘要

吸附在接触面上的硅酮蒸气在大气中受到放电引起的高温作用时,吸附的硅酮分子经化学分解形成SiO/sub 2/。当SiO/sub - 2/在接触表面形成并被捕获在触点界面中时,SiO/sub - 2/的绝缘特性导致触点失效。将新研制的掺少量Mg的Ag(40wt%)-Pd(60wt%)合金触头材料实验应用于微型继电器。与普通的Ag-Pd接触相比,该材料对污染氧化膜的接触电阻性能有显著改善。在本研究中,在饱和(1300 ppm)硅酮蒸气的大范围电条件下,研究了Ag-Pd-Mg合金的接触电阻特性。得到的接触电阻性能与Ag-Pd合金本身及Ag-Pd包覆层(Au(90wt%)-Ag(10wt%))进行了比较。结果表明,Ag-Pd-Mg合金在有机硅环境下具有较长的低接触电阻性能。通过去除接触痕迹形成的粉末制品的清洗效果,阐明了低接触电阻性能的机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of Mg doping on increase in the life with low contact resistance of Ag-Pd alloy switching contacts in silicone vapor environments
When silicone vapor which adsorbed on contact surfaces is subjected to high temperature due to electric discharge in the atmosphere, SiO/sub 2/ is formed by chemical decomposition of the adsorbed silicone molecular. When SiO/sub 2/ is formed on contact surfaces and is caught in the interface of contacts, contact failure is caused by an insulation property of SiO/sub 2/. Newly developed contact material of Ag(40wt%)-Pd(60wt%) alloy with a small amount dopant of Mg was applied experimentally to a micro relay. This material shows remarkable improvement of contact resistance property for contaminant oxide film in comparison with usual Ag-Pd contacts. In this study, the contact resistance property for the number of make-break switching operations of the Ag-Pd-Mg alloy was examined by wide range electrical conditions under saturated (1300 ppm) silicone vapor. Obtained contact resistance properties were compared with the Ag-Pd alloy itself and Ag-Pd overlaid with Au(90wt%)-Ag(10wt%) which is used usually. As results, prolonged low contact resistance property of the Ag-Pd-Mg alloy for silicone environment was found. The mechanism of the low contact resistance property was clarified by cleaning effect based on removal of powder products formed from the contact traces.
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