{"title":"多层介质基片上超高速微带线的有效介电常数新模型:导体-介电相效应","authors":"H. T. Vo, C. Davidson, F. Shi","doi":"10.1109/ECTC.2002.1008077","DOIUrl":null,"url":null,"abstract":"The existing CAD formulae are complicated and inaccurate at high frequencies. In particular, no closed-form expression has been obtained for the effective dielectric constant of microstrip lines on multi-layed dielectric substrate by considering the line-substrate interphase effect, although attempts have been made to study the finite thickness effect of the conductor and dielectric substrate. The present work represents the first attempt to obtain a closed-form CAD formula for the effective dielectric constant of microstrip lines on dielectric substrates by considering the effect of conductor-substrate interphase, in addition to the skin effect losses, dielectric loss, dispersion and radiation losses based on the quasi-TEM assumption and the superposition of partial capacitance. The model is verified by experimental observations on the effective dielectric constant and its dependence on microstrip dimension and frequency.","PeriodicalId":285713,"journal":{"name":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"New effective dielectric constant model for ultra-high speed microstrip lines on multilayer dielectric substrates: effect of conductor-dielectric interphase\",\"authors\":\"H. T. Vo, C. Davidson, F. Shi\",\"doi\":\"10.1109/ECTC.2002.1008077\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The existing CAD formulae are complicated and inaccurate at high frequencies. In particular, no closed-form expression has been obtained for the effective dielectric constant of microstrip lines on multi-layed dielectric substrate by considering the line-substrate interphase effect, although attempts have been made to study the finite thickness effect of the conductor and dielectric substrate. The present work represents the first attempt to obtain a closed-form CAD formula for the effective dielectric constant of microstrip lines on dielectric substrates by considering the effect of conductor-substrate interphase, in addition to the skin effect losses, dielectric loss, dispersion and radiation losses based on the quasi-TEM assumption and the superposition of partial capacitance. The model is verified by experimental observations on the effective dielectric constant and its dependence on microstrip dimension and frequency.\",\"PeriodicalId\":285713,\"journal\":{\"name\":\"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2002.1008077\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2002.1008077","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New effective dielectric constant model for ultra-high speed microstrip lines on multilayer dielectric substrates: effect of conductor-dielectric interphase
The existing CAD formulae are complicated and inaccurate at high frequencies. In particular, no closed-form expression has been obtained for the effective dielectric constant of microstrip lines on multi-layed dielectric substrate by considering the line-substrate interphase effect, although attempts have been made to study the finite thickness effect of the conductor and dielectric substrate. The present work represents the first attempt to obtain a closed-form CAD formula for the effective dielectric constant of microstrip lines on dielectric substrates by considering the effect of conductor-substrate interphase, in addition to the skin effect losses, dielectric loss, dispersion and radiation losses based on the quasi-TEM assumption and the superposition of partial capacitance. The model is verified by experimental observations on the effective dielectric constant and its dependence on microstrip dimension and frequency.