多层介质基片上超高速微带线的有效介电常数新模型:导体-介电相效应

H. T. Vo, C. Davidson, F. Shi
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引用次数: 9

摘要

现有的CAD公式在高频情况下复杂且不准确。特别是考虑线-衬底间相效应的多层介质衬底上微带线的有效介电常数,虽然曾尝试研究导体和介质衬底的有限厚度效应,但没有得到封闭形式的表达式。本文首次尝试在准瞬变电磁法假设和部分电容叠加的基础上,考虑导体-衬底间相的影响,以及集肤效应损耗、介电损耗、色散和辐射损耗,得到介电衬底上微带线有效介电常数的封闭式CAD公式。通过对有效介电常数及其与微带尺寸和频率的关系的实验观察,验证了该模型的正确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
New effective dielectric constant model for ultra-high speed microstrip lines on multilayer dielectric substrates: effect of conductor-dielectric interphase
The existing CAD formulae are complicated and inaccurate at high frequencies. In particular, no closed-form expression has been obtained for the effective dielectric constant of microstrip lines on multi-layed dielectric substrate by considering the line-substrate interphase effect, although attempts have been made to study the finite thickness effect of the conductor and dielectric substrate. The present work represents the first attempt to obtain a closed-form CAD formula for the effective dielectric constant of microstrip lines on dielectric substrates by considering the effect of conductor-substrate interphase, in addition to the skin effect losses, dielectric loss, dispersion and radiation losses based on the quasi-TEM assumption and the superposition of partial capacitance. The model is verified by experimental observations on the effective dielectric constant and its dependence on microstrip dimension and frequency.
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