{"title":"基于33 GHz - 50 GHz频段的毫米波和亚毫米波频率VNA校准方案性能评估","authors":"K. Dražil, A. Pavlis, M. Hudlička","doi":"10.1109/ARFTG.2015.7381470","DOIUrl":null,"url":null,"abstract":"In this article vector network analyzer (VNA) calibration schemes suitable for traceable scattering parameter measurements in rectangular waveguides at millimeter-wave and submillimeter-wave frequencies are compared with well-established techniques being used at lower frequencies. Comparison measurements were performed in the frequency band 33 GHz-50 GHz.","PeriodicalId":170825,"journal":{"name":"2015 86th ARFTG Microwave Measurement Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz–50 GHz band\",\"authors\":\"K. Dražil, A. Pavlis, M. Hudlička\",\"doi\":\"10.1109/ARFTG.2015.7381470\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article vector network analyzer (VNA) calibration schemes suitable for traceable scattering parameter measurements in rectangular waveguides at millimeter-wave and submillimeter-wave frequencies are compared with well-established techniques being used at lower frequencies. Comparison measurements were performed in the frequency band 33 GHz-50 GHz.\",\"PeriodicalId\":170825,\"journal\":{\"name\":\"2015 86th ARFTG Microwave Measurement Conference\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 86th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2015.7381470\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 86th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2015.7381470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz–50 GHz band
In this article vector network analyzer (VNA) calibration schemes suitable for traceable scattering parameter measurements in rectangular waveguides at millimeter-wave and submillimeter-wave frequencies are compared with well-established techniques being used at lower frequencies. Comparison measurements were performed in the frequency band 33 GHz-50 GHz.