电源电压故障对CMOS电路的影响

Anissa Djellid-Ouar, Guy Cathebras, Frédéric Bancel
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引用次数: 19

摘要

在应用于安全电路的攻击中,故障注入技术包括使用一系列环境条件的组合,这些环境条件会导致芯片中的计算错误,从而泄露受保护的信息。我们研究的目的是建立一个精确的模型,能够描述CMOS电路在故意短路电压变化情况下的行为。这种行为强烈依赖于构成电路的基本门(组合逻辑,寄存器…)。在本文中,我们展示了为什么d触发器可以抵抗时钟转换之间发生的电源故障,并且我们提出了一种方法来评估基本元件对电源故障产生的故障的灵敏度。因此,我们的目标模型将依赖于这种敏感性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Supply voltage glitches effects on CMOS circuits
Among the attacks applied on secure circuits, fault injection techniques consist in the use of a combination of environmental conditions that induce computational errors in the chip that can leak protected informations. The purpose of our study is to build an accurate model able to describe the behaviour of CMOS circuits in presence of deliberated short supply voltage variations. This behaviour depends strongly on the basic gates (combinational logic, registers...) that make up the circuit. In this paper, we show why D-flip-flop are resistant to power supply glitches occurring between clock transitions and we propose an approach to evaluate the basic elements sensitivities towards faults generated by power glitches. Our aimed model will consequently be dependent on this sensitivity
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