钙钛矿半导体中离子迁移率测定用流动条纹诱导的光电动势

A. K. Vega Salgado, N. Korneev, R. Valencia Yescas, S. Mansurova, K. Meerholz, Ismael Cosme Bolaños
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引用次数: 0

摘要

我们已经从理论上和实验上证明了以恒定速度运动的干涉图案所产生的电流可以用来确定钙钛矿半导体中的离子迁移率和活化能。信号的频率依赖性具有理论预测的特征:高频峰对应于电子/空穴光导弛豫过程,低频峰发生在干涉图样的速度与离子运动同步时;通过确定峰的位置,就可以估计离子迁移率。离子迁移率和活化能的数值与文献报道的数据一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photo electromotive force induced by running fringes for determination of ion mobility in perovskite semiconductors
We have demonstrated theoretically and experimentally that the current induced by an interference pattern moving at constant velocity can be used to determine the ion mobility and activation energy in perovskite semiconductors. The frequency dependence of the signal has features predicted by theory: the high-frequency peak corresponds to the electron/hole photoconductivity relaxation process, and the low-frequency peak occurs when the velocity of the interference pattern synchronizes with the ion motion; by determining the peak’s position, it becomes possible to estimate the ion mobility. The values of ion mobility and activation energy agree with the data reported in the literature.
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