{"title":"匹配n口功率放大器组合器的优雅退化特性","authors":"R. L. Ernst, R. Camisa, A. Presser","doi":"10.1109/MWSYM.1977.1124396","DOIUrl":null,"url":null,"abstract":"The graceful degradation properties of matched isolated power combiners as a function of amplifier failures of the same type has been determined using general techniques applicable to all such circuits. The effects of complete amplifier failures, amplitude and phase imbalances and poor VSWRs on overall combiner system output power, combining efficiency and input-output impedances can be determined by the resulting equations and plots.","PeriodicalId":299607,"journal":{"name":"1977 IEEE MTT-S International Microwave Symposium Digest","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"Graceful Degradation Properties of Matched N-Port Power Amplifier Combiners\",\"authors\":\"R. L. Ernst, R. Camisa, A. Presser\",\"doi\":\"10.1109/MWSYM.1977.1124396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The graceful degradation properties of matched isolated power combiners as a function of amplifier failures of the same type has been determined using general techniques applicable to all such circuits. The effects of complete amplifier failures, amplitude and phase imbalances and poor VSWRs on overall combiner system output power, combining efficiency and input-output impedances can be determined by the resulting equations and plots.\",\"PeriodicalId\":299607,\"journal\":{\"name\":\"1977 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1977-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1977.1124396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1977.1124396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Graceful Degradation Properties of Matched N-Port Power Amplifier Combiners
The graceful degradation properties of matched isolated power combiners as a function of amplifier failures of the same type has been determined using general techniques applicable to all such circuits. The effects of complete amplifier failures, amplitude and phase imbalances and poor VSWRs on overall combiner system output power, combining efficiency and input-output impedances can be determined by the resulting equations and plots.
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