洗牌/交换+网络

ACM-SE 20 Pub Date : 1982-04-01 DOI:10.1145/503896.503912
S. Thanawastien
{"title":"洗牌/交换+网络","authors":"S. Thanawastien","doi":"10.1145/503896.503912","DOIUrl":null,"url":null,"abstract":"From the reliability point of view, the uniqueness of path between any processor and memory module in a standard k-column Shuffle/Exchange (S/E) network is an inherent weakness. It is proposed to add a column of switches to the existing multistage S/E network such that the modified network, which will be called the S/E-Plus network, will retain the permuting power of the corresponding S/E network and have dual paths between any processor and any memory module. Fault tolerant routing algorithm is then designed to exploit the dual path structure of the S/E-Plus network. Various applications of the routing algorithm including a technique for performing permutation in the S/E-Plus network in which a fault exists are also discussed. Finally, the path reliability and the path reliability gain are defined to evaluate the S/E-Plus network.","PeriodicalId":184493,"journal":{"name":"ACM-SE 20","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"The shuffle/exchange-plus networks\",\"authors\":\"S. Thanawastien\",\"doi\":\"10.1145/503896.503912\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"From the reliability point of view, the uniqueness of path between any processor and memory module in a standard k-column Shuffle/Exchange (S/E) network is an inherent weakness. It is proposed to add a column of switches to the existing multistage S/E network such that the modified network, which will be called the S/E-Plus network, will retain the permuting power of the corresponding S/E network and have dual paths between any processor and any memory module. Fault tolerant routing algorithm is then designed to exploit the dual path structure of the S/E-Plus network. Various applications of the routing algorithm including a technique for performing permutation in the S/E-Plus network in which a fault exists are also discussed. Finally, the path reliability and the path reliability gain are defined to evaluate the S/E-Plus network.\",\"PeriodicalId\":184493,\"journal\":{\"name\":\"ACM-SE 20\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM-SE 20\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/503896.503912\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM-SE 20","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/503896.503912","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

从可靠性的角度来看,在标准的k列Shuffle/Exchange (S/E)网络中,任何处理器和内存模块之间的路径的唯一性是一个固有的弱点。建议在现有的多级S/E网络上增加一列交换机,使改造后的S/E- plus网络保留相应S/E网络的置换能力,并在任意处理器和任意存储模块之间具有双路径。利用S/E-Plus网络的双路径结构,设计了容错路由算法。还讨论了路由算法的各种应用,包括在存在故障的S/E-Plus网络中执行排列的技术。最后,定义了路径可靠性和路径可靠性增益来评估S/E-Plus网络。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The shuffle/exchange-plus networks
From the reliability point of view, the uniqueness of path between any processor and memory module in a standard k-column Shuffle/Exchange (S/E) network is an inherent weakness. It is proposed to add a column of switches to the existing multistage S/E network such that the modified network, which will be called the S/E-Plus network, will retain the permuting power of the corresponding S/E network and have dual paths between any processor and any memory module. Fault tolerant routing algorithm is then designed to exploit the dual path structure of the S/E-Plus network. Various applications of the routing algorithm including a technique for performing permutation in the S/E-Plus network in which a fault exists are also discussed. Finally, the path reliability and the path reliability gain are defined to evaluate the S/E-Plus network.
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