{"title":"损耗基板上耦合微带的横线参数","authors":"D. Assante, L. Verolino","doi":"10.1109/EMCZUR.2007.4388256","DOIUrl":null,"url":null,"abstract":"This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"50 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transverse line parameters of coupled microstrips on a lossy substrate\",\"authors\":\"D. Assante, L. Verolino\",\"doi\":\"10.1109/EMCZUR.2007.4388256\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.\",\"PeriodicalId\":397061,\"journal\":{\"name\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"50 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2007.4388256\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2007.4388256","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transverse line parameters of coupled microstrips on a lossy substrate
This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.
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