FE-STEM法XLPE形貌直接观察技术

Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) Pub Date : 1993-10-17 DOI:10.1109/CEIDP.1993.378882

M. Ishida, T. Okamoto

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引用次数: 0

摘要

采用新型场发射型电子源和电子束扫描相结合的场发射透射扫描电子显微镜(FE-STEM)对交联聚乙烯(XLPE)绝缘材料的微观形貌进行了直接观察。利用FE-STEM方法可以观察到未染色XLPE绝缘体的球晶结构(密度差)。XLPE绝热层中球晶结构的密度高于球晶之间的密度。这些球晶结构是分散的，没有清晰的边界。

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Direct observation technique of XLPE morphology through the FE-STEM method

The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders.<>

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Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)

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