混合信号测试

A. Majhi, V. Agrawal
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引用次数: 15

摘要

模拟电路的测试过程目前侧重于性能验证,通常称为功能测试。对于许多种类的模拟电路,已经有了众所周知和公认的功能测试。然而,测试开发时间和测试集应用时间对于今天的电路来说太长了。对于新产品,较短的产品周期和上市时间是关键的考虑因素。测试开发时间有两个主要因素:噪声的存在和缺乏强大的工具、模型和实践。此外,据报道,在许多系统应用中,功能测试都失败了。今天,人们比以前更经常地认为结构测试是一种可行的解决方案。本文简要介绍了混合信号测试的发展趋势和面临的挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mixed-signal test
The test process for analog circuits currently focuses on performance verification, generally known as functional testing. For many classes of analog circuits, there are already well-known and accepted functional tests. However, the test development time and test set application time are too long for today's circuits. For new products, short product cycles and time-to-market are critical considerations. Test development time has two main factors: the presence of noise and a lack of powerful tools, models and practices. Besides, functional testing has been reported to fail in many system applications. Today, more often than before, there is a consensus that structural testing is a viable solution. A brief survey of the current trends and challenges in mixed-signal testing is given in this paper.
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