{"title":"混合信号测试","authors":"A. Majhi, V. Agrawal","doi":"10.1109/ICVD.1998.646619","DOIUrl":null,"url":null,"abstract":"The test process for analog circuits currently focuses on performance verification, generally known as functional testing. For many classes of analog circuits, there are already well-known and accepted functional tests. However, the test development time and test set application time are too long for today's circuits. For new products, short product cycles and time-to-market are critical considerations. Test development time has two main factors: the presence of noise and a lack of powerful tools, models and practices. Besides, functional testing has been reported to fail in many system applications. Today, more often than before, there is a consensus that structural testing is a viable solution. A brief survey of the current trends and challenges in mixed-signal testing is given in this paper.","PeriodicalId":139023,"journal":{"name":"Proceedings Eleventh International Conference on VLSI Design","volume":"189 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Mixed-signal test\",\"authors\":\"A. Majhi, V. Agrawal\",\"doi\":\"10.1109/ICVD.1998.646619\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The test process for analog circuits currently focuses on performance verification, generally known as functional testing. For many classes of analog circuits, there are already well-known and accepted functional tests. However, the test development time and test set application time are too long for today's circuits. For new products, short product cycles and time-to-market are critical considerations. Test development time has two main factors: the presence of noise and a lack of powerful tools, models and practices. Besides, functional testing has been reported to fail in many system applications. Today, more often than before, there is a consensus that structural testing is a viable solution. A brief survey of the current trends and challenges in mixed-signal testing is given in this paper.\",\"PeriodicalId\":139023,\"journal\":{\"name\":\"Proceedings Eleventh International Conference on VLSI Design\",\"volume\":\"189 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-01-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Eleventh International Conference on VLSI Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICVD.1998.646619\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Eleventh International Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1998.646619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The test process for analog circuits currently focuses on performance verification, generally known as functional testing. For many classes of analog circuits, there are already well-known and accepted functional tests. However, the test development time and test set application time are too long for today's circuits. For new products, short product cycles and time-to-market are critical considerations. Test development time has two main factors: the presence of noise and a lack of powerful tools, models and practices. Besides, functional testing has been reported to fail in many system applications. Today, more often than before, there is a consensus that structural testing is a viable solution. A brief survey of the current trends and challenges in mixed-signal testing is given in this paper.