关于乘数的内置自检

Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon) Pub Date : 2010-03-18 DOI:10.1109/SECON.2010.5453929

Mary D. Pulukuri, George J. Starr, C. Stroud

{"title":"关于乘数的内置自检","authors":"Mary D. Pulukuri, George J. Starr, C. Stroud","doi":"10.1109/SECON.2010.5453929","DOIUrl":null,"url":null,"abstract":"We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs).1","PeriodicalId":286940,"journal":{"name":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"On Built-In Self-Test for multipliers\",\"authors\":\"Mary D. Pulukuri, George J. Starr, C. Stroud\",\"doi\":\"10.1109/SECON.2010.5453929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs).1\",\"PeriodicalId\":286940,\"journal\":{\"name\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SECON.2010.5453929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SECON.2010.5453929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 7

摘要

我们评估了一些以前提出的测试算法和方法的各种类型的乘数。我们提出了独立于其架构的有效测试乘法器的方法，并通过简单的8位或9位二进制上行计数器和一些多路复用器实现大于99%的单卡在门级故障覆盖率。最后，我们讨论了测试目前大多数现场可编程门阵列(fgpa)中的乘法器

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

On Built-In Self-Test for multipliers

We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs).1

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the IEEE SoutheastCon 2010 (SoutheastCon)

自引率

0.00%

发文量