基于TCAD仿真的单事件闭锁建模新方法及实验分析设计

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745658

D. Truyen, L. Montagner

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引用次数: 2

摘要

本文提出了一种基于物理模拟和DOE分析的预测SEL建模方法。该模型由布局和流程输入建立，并通过估计LET阈值来评估SEL风险。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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New Approach of Single Event Latchup Modeling Based on TCAD Simulations and Design of Experiment Analysis

This work presents a predictive SEL modeling based on physical simulations and DOE analysis. The model is built from layout and process inputs and evaluates the SEL risk by estimating the LET threshold.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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