白光连续光谱干涉法测量各向异性晶体色散特性

CLEO/Europe Conference on Lasers and Electro-Optics Pub Date : 1998-09-14 DOI:10.1109/CLEOE.1998.719260

H. Delbarre, C. Przygodzki, D. Boucher

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引用次数: 0

摘要

白光光谱干涉测量法最近被证明可以非常精确地测定色散[1,2]。在通常的各向同性材料(玻璃)中，在非线性拟合过程中使用正确的色散规则(例如Sellmeier或Cauchy公式)可以提高指数的精度(约为10−5)。

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White-Light Continuum Spectral Interferometry for Dispersion Characteristics Measurements in Anisotropic Crystals

White-light spectral interferometry has been recently demonstrated to allow a very precise determination of dispersion [1, 2]. In usual isotropic materials (glass), the use of a correct dispersion rule (Sellmeier or Cauchy formula for instance) in a nonlinear fitting procedure can lead to an enhanced accuracy (of the order of 10−5) for the indices.

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CLEO/Europe Conference on Lasers and Electro-Optics

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