SAR TDC架构的一次定时测量与全数字实现

Yuki Ozawa, Takashi Ida, Shotaro Sakurai, Richen Jiang, R. Takahashi, Haruo Kobayashi, Ryoji Shiota
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引用次数: 6

摘要

本文提出了一种连续逼近寄存器(SAR)时数转换器(TDC)结构,该结构能够在全数字FPGA上测量两个单次信号之间的时间差。SAR TDC适用于FPGA芯片上的多通道定时内置自检(BOST)实现。在传统的Flash TDC或游标TDC中,为了减少缓冲区和dff的数量,采用了SAR结构。但是,SAR TDC只能测量重复时钟定时,不能测量单次定时信号。因此,我们首先在SAR TDC前端采用触发电路来测量单次定时,但触发电路中包含一些模拟电路,这给数字FPGA的实现带来了困难。然后,我们在这里提出了一个SAR-TDC架构,该架构可以使用环形振荡器实现单次定时,从而实现全数字FPGA。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SAR TDC architecture for one-shot timing measurement with full digital implementation
This paper proposes a successive approximation register (SAR) time-to-digital converter (TDC) architecture capable of measuring the timing difference between two single-shot signals with full digital FPGA. The SAR TDC is suitable for multi-channel timing built-out self-test (BOST) implementation on an FPGA chip. In order to reduce the number of buffers and DFFs in a conventional Flash TDC or Vernier TDC, the SAR architecture is applied. However, the SAR TDC can measure only the repetitive clock timing, and it cannot measure the single-shot timing signal. So first we employ trigger circuits in front of the SAR TDC to measure the single-shot timing, but the trigger circuits include some analog circuits so that its digital FPGA implementation is difficult. Then we propose here an SAR-TDC architecture that enables the single-shot timing using ring oscillators, which leads to its full digital FPGA implementation.
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