分解聚乳酸，减少并发检查的成本

Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1992-11-04 DOI:10.1109/DFTVS.1992.224375

D. Wessels, J. Muzio

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引用次数: 0

摘要

提出了一种PLA分解和单向错误检测技术的组合，该技术允许对电路中的所有单个故障(在分解模块和互连线路上)进行并发测试，并且比通常与单向错误检测代码相关的区域开销成本更低。

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PLA decomposition to reduce the cost of concurrent checking

Proposes a combination of PLA decomposition and unidirectional error detecting techniques which permits concurrent testing for all single faults in a circuit (both in the decomposed modules and on the interconnection lines), for a lower area overhead cost than is normally associated with unidirectional error detecting codes.<>

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来源期刊

Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

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