离轴激光沉积制备纹理化LiNbO/ sub3 /薄膜及其表征

K. Kaemmer, K. Franke, B. Holzapfel, D. Stephan, M. Weihnacht
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摘要

本文报道了利用离轴激光沉积技术在(01.2)和(0001)蓝宝石和LaAlO/sub 3/(01.2)单晶衬底上制备铌酸锂薄膜。利用Bragg-Brentano几何x射线衍射和带面积检测器的微衍射仪表征了薄膜的晶体学、织构和横向均匀性。我们用原子力显微镜(AFM)和扫描电子显微镜(SEM)检查了膜的形态。在制备薄膜时,改变了沉积温度、沉积压力和背景压力的氧氩比。薄膜在所使用的衬底上有纹理和取向。对于LaAlO/sub 3/衬底上的薄膜,我们在Bragg-Brentano衍射仪中发现薄膜和衬底的反射只有(01.2)。这表明薄膜是定向生长的,由单一的LiNbO/sub - 3/相组成。用微衍射仪研究表明,薄膜中还存在一定量的LiNb/亚3/O/亚8/织构相。在蓝宝石衬底上沉积的薄膜由不同的LiNbO/sub - 3/相和LiNb/sub - 3/O/sub - 8/相组成,这取决于周围大气的氧氩比。在氧氩比为1:4时,膜主要由取向LiNbO/ sub3 /组成。用电扫描力显微镜研究了薄膜的介电极化和畴结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Preparation of textured LiNbO/sub 3/ thin films by off-axis laser deposition and their characterization
We report on the preparation of lithium niobate thin films on (01.2) and (0001) sapphire and LaAlO/sub 3/ (01.2) single crystalline substrates using off-axis laser deposition. X-ray diffraction in Bragg-Brentano geometry and in a microdiffractometer with an area detector were used to characterize the crystallography, the texture and the lateral homogeneity of the films. We examined the film morphology with atomic force microscopy (AFM) and scanning electron microscopy (SEM). For the preparation of thin films, the deposition temperature, the deposition pressure and the oxygen-Ar ratio of background pressure were varied. The films grow textured and oriented on the substrates used. For thin films on LaAlO/sub 3/ substrates we found only (01.2) reflections of film and substrate in the Bragg-Brentano diffractometer with its selective reflection recording. This suggests that the films are oriented grown and consist of a single LiNbO/sub 3/ phase. Investigations with the microdiffractometer showed that there is also an amount of a LiNb/sub 3/O/sub 8/ textured phase in the films. Thin films deposited on sapphire substrates consist of different mixtures of the LiNbO/sub 3/ phase and the LiNb/sub 3/O/sub 8/ phase depending on the oxygen-Ar ratio of ambient atmosphere. At an oxygen-Ar ratio of 1:4, the films consist mainly of oriented LiNbO/sub 3/. The dielectric polarization and domain structure of the films were investigated by electric scanning force microscopy.
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