{"title":"无误差电磁干扰测量及其概念","authors":"K. R. Rajeswara Rao, K. Suryanarayana","doi":"10.1109/ICEMIC.1997.669752","DOIUrl":null,"url":null,"abstract":"Error free EMI measurements play an integrating role between theoretical concepts and practical approaches/concepts. Theoretical concepts in EMI/EMC do not provide a sufficient database for scientists/engineers. It is also essential to have a knowledge base of the correct method of carrying out EMI/EMC measurements. It is very important to identify the level of EMI compatibility of the simulation and peripherals of the unit under test. In this paper the authors bring out some of the practical concepts of error free measurements and the compatibility of systems/subsystems, and also bring out practical examples of committed mistakes/errors during the EMI/EMC performance evaluation.","PeriodicalId":444507,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility '99 (IEEE Cat. No. 99TH 8487)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Error free EMI measurements and its concepts\",\"authors\":\"K. R. Rajeswara Rao, K. Suryanarayana\",\"doi\":\"10.1109/ICEMIC.1997.669752\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Error free EMI measurements play an integrating role between theoretical concepts and practical approaches/concepts. Theoretical concepts in EMI/EMC do not provide a sufficient database for scientists/engineers. It is also essential to have a knowledge base of the correct method of carrying out EMI/EMC measurements. It is very important to identify the level of EMI compatibility of the simulation and peripherals of the unit under test. In this paper the authors bring out some of the practical concepts of error free measurements and the compatibility of systems/subsystems, and also bring out practical examples of committed mistakes/errors during the EMI/EMC performance evaluation.\",\"PeriodicalId\":444507,\"journal\":{\"name\":\"Proceedings of the International Conference on Electromagnetic Interference and Compatibility '99 (IEEE Cat. No. 99TH 8487)\",\"volume\":\"85 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference on Electromagnetic Interference and Compatibility '99 (IEEE Cat. No. 99TH 8487)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEMIC.1997.669752\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility '99 (IEEE Cat. No. 99TH 8487)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMIC.1997.669752","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Error free EMI measurements play an integrating role between theoretical concepts and practical approaches/concepts. Theoretical concepts in EMI/EMC do not provide a sufficient database for scientists/engineers. It is also essential to have a knowledge base of the correct method of carrying out EMI/EMC measurements. It is very important to identify the level of EMI compatibility of the simulation and peripherals of the unit under test. In this paper the authors bring out some of the practical concepts of error free measurements and the compatibility of systems/subsystems, and also bring out practical examples of committed mistakes/errors during the EMI/EMC performance evaluation.