X. Sun, R. Bai, F. Zhuo, B. Zhao, Y. Lou, Q. Liu, X. Wang
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Measurement and analysis of clamp circuit loss of IGCT-MMC sub-module
Integrated gate commutator thyristor (IGCT) has the advantages of low on-state loss and strong forward current capability, and has the potential for further development. It is suitable for the application of modular multilevel converter (MMC). In this paper, clamping loss of IGCT-based MMC is evaluated. Firstly, the loss caused by various switching behaviours is analysed. The clamping loss caused by IGCT turning-on and turning-off under different current is measured by setting up an experimental circuit. Finally, the clamp loss in specific parameters of MMC is analysed by means of mean equivalent method. The analysis shows that the clamp loss accounts for about 5% of the total loss of the module.